Gaurab Banerjee, Indian Institute of Science.
Title: Challenges in RF/mm-wave Integrated Circuit Testing
Abstract:

CMOS scaling has led to 400 GHz+ transition frequencies in MOS devices. This has enabled reliable CMOS based product design at millimeter wave frequencies. Most notable among these products are radars-on-chip at 24 and 77 GHz, short range high bandwidth links at 60 GHz and 5G mm-wave radios at 28 GHz. The mm-wave part of the spectrum, which was previously unused, presents a great commercial opportunity to the semiconductor industry.
The cost of testing integrated circuits is now as much as the cost of fabrication and packaging in many RF product implementations.  This simultaneously presents a significant business challenge and opportunity.

In this talk, the speaker will present a top-down look at smart phones, with specific emphasis on CMOS transceivers. This will be followed by a discussion of basic considerations in RF transceiver testing. Next, an integrated BIST subsystem implemented in 65-nm CMOS commercial product will be described, followed by a discussion on the testing of mm-wave Circuits,  in terms of their difference from RF circuits at sub-6 GHz frequencies. The talk will conclude with a detailed discussion on mm-wave BIST, and a brief look at future opportunities.

Bio:

Dr. Gaurab Banerjee received the B.Tech. (Hons) degree from IIT Kharagpur, the M.S. degree from Auburn University and the Ph.D. degree from the University of Washington, Seattle, all in electrical engineering. In 1999, he joined Intel Corporation, Hillsboro, OR, USA, to design analog and mixed-signal integrated circuits (ICs) for the first Pentium-4 microprocessor. From 2001 to 2007, he was with Intel Labs, where he worked on CMOS-based analog, mixed-signal, and RF circuits for wireless and wireline communication systems. From 2007 to 2010, he was with Qualcomm Inc., in Austin, TX, USA, where he was involved in RFIC design for mobile broadcast video applications and the inclusion of an industry-first BIST subsystem in an RFIC product.  He joined the Department of Electrical Communication Engineering at Indian Institute of Science in 2010, where he is currently an Associate Professor. His research interests include the design and test of analog and RFICs and systems for communication and sensor applications.

Dr. Banerjee is a National Talent Search Scholar of India.  He has also received the Visveswaraya Faculty Fellowship from the Ministry of Electronics and Information Technology of the Government of India. Dr. Banerjee was an Associate Editor of the IEEE Transactions on Circuits and Systems: Part-I, from 2008 to 2010. He has served as a reviewer for many IEEE journals and conferences.